Agilent's Scanning Microwave Microscopy collects another award
Named one of 10 SPIE 2009 Prism Awards winners, the Scanning Microwave Microscopy Mode (SMM Mode) instruments from Agilent Technologies Inc. earned an R&D 100 Award in 2009 for this useful adaptation of the atomic force microscope for use in the semiconductor industry.
Agilent's Scanning Microwave Microscopy collects another award
Named one of 10 SPIE 2009 Prism Awards winners, the Scanning Microwave Microscopy Mode (SMM Mode) instruments from Agilent Technologies Inc. earned an R&D 100 Award in 2009 for this useful ...
Mon 8 Feb 10 from R&D Mag
Agilent's Scanning Microwave Microscopy Mode Wins Prism Award
Agilent Technologies Inc. (NYSE: A) today announced that its Scanning Microwave Microscopy Mode (SMM Mode) has been named one of 10 2009 Prism Award winners by judges from SPIE and the advisory ...
Mon 8 Feb 10 from R&D Mag
Agilent Technologies SMM Mode Named Winner of 2009 Prism Award, Mon 8 Feb 10 from AZoNano
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